Practical and highly sensitive elemental analysis for aqueous samples containing metal impurities employing electrodeposition on indium-tin oxide film samples and laser-induced shock wave plasma in low-pressure helium gas
Publication Name : Applied Optics
DOI : 10.1364/AO.54.007592
Date : 1 September 2015
Type
Journal
ISSN
1559128X
Volume
54
Page
7592-7597